Exabis Library

Authors: Martin, J.(1,2);Aksan, A.(1,2,3);Steinhilber, D.(2);Ulrich-Rückert, S.(1,2);Stein, J.M.(1,2,4);

Authors:

M.N. Quraishi¹,²,³*, A. Acharjee²,⁴, E. Liaskou¹, A. Rossiter⁵, C. Tselepis⁴, G. Gkoutos²,⁴, S. Ghosh²,³, G. Hirschfield¹, D. Withers⁶, T.H. Iqbal²,³

Authors:

Coope A.^*1, Botezelli J.D.², Bitencourt Pascoal L.¹, Ramos Silva F.¹, Ayrizono M.L.S.¹, Milanski M.², Velloso L.A.³, Leal R.F.¹

Authors:

Authors:

E. Tristan, A. Carrasco, A. Martín-Cardona, Y. Zabana, M. Aceituno, D. Horta, X. Andújar, I. Salvador, C. Loras, F. Fernández-Bañares, M. Esteve

Authors:

M. Lampinen*¹, A. Fredricsson¹, J. Vessby¹, A. Wanders², F. Rorsman¹, M. Carlson¹

Authors: Iakovlev, A.A.(1);Volkov, A.(2);Tarasova, G.(2);Zubova, A.(2);

Authors:

Stremmel W., Staffer S., Stuhrmann N., Gauss A., Burger N., Hornuss D.

Authors: Al-Ani, A.(1)*;Samson, A.(2);Rickard, J.(3);Christensen, B.(4);Murphy, J.(2);

Authors: Gordon, H.(1);Rodger, B.(2);Hornsby, E.(2);McGuire, J.(1);Kok, K.B.(1);Lindsay, J.O.(1);Stagg, A.J.(2);

Authors:

J. Seidelin*¹, F. H. Bergenheim¹, O. H. Nielsen¹

Authors:

M. Chaparro¹, M. Azkargorta², A. Lapitz³, L. Ortega-Moreno¹, I. Iloro², A. Arbelaiz³, I. Escobes², S. Fernández-Tomé¹, A.C. Marin¹, M. Baldan-Martin¹, J.M. Falcon-Perez², L. Bujanda³, D. Bernardo¹, J. Banales³, F. Elortza², J.P. Gisbert¹

Authors: Singh, R.(1,2);Rossini, V.(1);Stockdale , S.(1);Draper, L.(1);Hill, C.(1,3);Nally, K.(1,4);Shanahan, F.(1);Andersson-Engels, S.(5,6);MelgarPhD, S.(1)*;

Authors:

Matsumoto Y., Fukuda A., Seno H.

Authors:

K. Zheng¹*, H. Shen¹, J. Jia²

Authors: Doherty, J.(1);Stack, R.(1);O' Morain, N.(1);Girod, P.(1);Tosetto, M.(1);Inzitari, R.(2);Sheridan, J.(1);Cullen, G.(1);Buckley, M.(3);Mulcahy, H.(1);Ryan, E.J.(4);Daghfal, D.(5);Doran, P.(2);O Morain, C.(6);Doherty, G.(1);

Authors:

K. B. Hahm*¹, N. Kangwan¹, Y. J. Kim²

Authors:

M. Barnhoorn*¹, K. Schepers², H. Verspaget¹, W. Fibbe², L. Hawinkels¹, M. van Pel², A. van der Meulen - de Jong¹

Authors: Zhang, Y.(1);Wang, C.(1);Yao, L.(1);Li, M.(1);Jin, J.(2);Cao, Q.(1);

Authors:

Y.S. Park¹, S.W. KIm², J.H. Cheon²